arXiv · 0907.3131
SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories
Abstract
The SAXS (small angle X-ray scattering) technique has been used to determine the fundamental structure of conducting thin films fabricated by implanting gold ions into PMMA (polymethylmethacrylate) polymer. We present a brief review of the SAXS theories necessary to determine the structural properties of our nanoheterogeneous films.
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M. Cattani, M. C. Salvadori, F. S. Teixeira. 2009-07-17. SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories. https://arxiv.org/abs/0907.3131
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