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arXiv · 1002.2742

A simple high-sensitivity technique for purity analysis of xenon gas

D. S. Leonard·A. Dobi·C. Hall·L. Kaufman·T. Langford·S. Slutsky·Y. R. Yen
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Abstract

We report on the development and performance of a high-sensitivity purity-analysis technique for gaseous xenon. The gas is sampled at macroscopic pressure from the system of interest using a UHV leak valve. The xenon present in the sample is removed with a liquid-nitrogen cold trap, and the remaining impurities are observed with a standard vacuum mass-spectroscopy device. Using calibrated samples of xenon gas spiked with known levels of impurities, we find that the minimum detectable levels of N2, O2, and methane are 1 ppb, 160 ppt, and 60 ppt respectively. This represents an improvement of about a factor of 10,000 compared to measurements performed without a coldtrap.

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D. S. Leonard, A. Dobi, C. Hall, L. Kaufman, T. Langford, S. Slutsky, Y. R. Yen. 2010-02-14. A simple high-sensitivity technique for purity analysis of xenon gas. https://doi.org/10.1016/j.nima.2010.04.152

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