arXiv · 1208.0519
Coherent Quantum Oscillations in a Silicon Charge Qubit
Abstract
Fast quantum oscillations of a charge qubit in a double quantum dot fabricated in a Si/SiGe heterostructure are demonstrated and characterized experimentally. The measured inhomogeneous dephasing time T2* ranges from 127ps to ~2.1ns; it depends substantially on how the energy difference of the two qubit states varies with external voltages, consistent with a decoherence process that is dominated by detuning noise(charge noise that changes the asymmetry of the qubit's double-well potential). In the regime with the shortest T2*, applying a charge-echo pulse sequence increases the measured inhomogeneous decoherence time from 127ps to 760ps, demonstrating that low-frequency noise processes are an important dephasing mechanism.
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Zhan Shi, C. B. Simmons, Daniel. R. Ward, J. R. Prance, R. T. Mohr, Teck Seng Koh, John King Gamble, Xian. Wu, D. E. Savage, M. G. Lagally, Mark Friesen, S. N. Coppersmith, M. A. Eriksson. 2012-08-02. Coherent Quantum Oscillations in a Silicon Charge Qubit. https://doi.org/10.1103/physrevb.88.075416
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