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arXiv · 1303.4985

Scale invariance of a diodelike tunnel junction

H. Cabrera·D. A. Zanin·L. G. De Pietro·Th. Michaels·P. Thalmann·U. Ramsperger·A. Vindigni·D. Pescia·A. Kyritsakis·J. P. Xanthakis·Fuxiang Li·Ar. Abanov
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Abstract

We measure the current vs voltage (I-V) characteristics of a diodelike tunnel junction consisting of a sharp metallic tip placed at a variable distance d from a planar collector and emitting electrons via electric-field assisted emission. All curves collapse onto one single graph when I is plotted as a function of the single scaling variable Vd^{-λ}, d being varied from a few mm to a few nm, i.e., by about six orders of magnitude. We provide an argument that finds the exponent λ within the singular behavior inherent to the electrostatics of a sharp tip. A simulation of the tunneling barrier for a realistic tip reproduces both the scaling behavior and the small but significant deviations from scaling observed experimentally.

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H. Cabrera, D. A. Zanin, L. G. De Pietro, Th. Michaels, P. Thalmann, U. Ramsperger, A. Vindigni, D. Pescia, A. Kyritsakis, J. P. Xanthakis, Fuxiang Li, Ar. Abanov. 2013-03-20. Scale invariance of a diodelike tunnel junction. https://doi.org/10.1103/physrevb.87.115436

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