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arXiv · 1406.7308

Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors

J. J. Yen·B. Shank·B. A. Young·B. Cabrera·P. L. Brink·M. Cherry·J. M Kreikebaum·R. Moffatt·P. Redl·A. Tomada·E. C. Tortorici
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Abstract

We report new experimental studies to understand the physics of phonon sensors which utilize quasiparticle diffusion in thin aluminum films into tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach.

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J. J. Yen, B. Shank, B. A. Young, B. Cabrera, P. L. Brink, M. Cherry, J. M Kreikebaum, R. Moffatt, P. Redl, A. Tomada, E. C. Tortorici. 2014-06-27. Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors. https://doi.org/10.1063/1.4899130

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