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arXiv · 1501.05966

Radiation Tolerance of 65nm CMOS Transistors

M. Krohn·B. Bentele·J. P. Cumalat·S. R. Wagner·D. C. Christian·G. Deptuch·F. Fahim·J. Hoff·A. Shenai
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Abstract

We report on the effects of ionizing radiation on 65nm CMOS transistors held at approximately -20C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature.

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M. Krohn, B. Bentele, J. P. Cumalat, S. R. Wagner, D. C. Christian, G. Deptuch, F. Fahim, J. Hoff, A. Shenai. 2015-11-24. Radiation Tolerance of 65nm CMOS Transistors. https://doi.org/10.1088/1748-0221%2F10%2F12%2Fp12007

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