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arXiv · 1603.02073

The test of the electronics system for the BESIII ETOF upgrade

Wang Xiaozhuang·Dai Hongliang·Wu Zhi·Heng Yuekun·Zhang Jie·Cao Ping·Ji Xiaolu·Li Cheng·Sun Weijia·Wang Siyu·Wang Yun
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Abstract

It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.

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Wang Xiaozhuang, Dai Hongliang, Wu Zhi, Heng Yuekun, Zhang Jie, Cao Ping, Ji Xiaolu, Li Cheng, Sun Weijia, Wang Siyu, Wang Yun. 2016-03-07. The test of the electronics system for the BESIII ETOF upgrade. https://arxiv.org/abs/1603.02073

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