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arXiv · 1609.07513

X-ray Fourier ptychographic microscopy

H. Simons·H. F. Poulsen·J. P. Guigay·C. Detlefs
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Abstract

Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-ray lenses. Furthermore, digital wave front correction (DWC) may be used to charaterize and correct lens imperfections. Given the diffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10 nm range.

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H. Simons, H. F. Poulsen, J. P. Guigay, C. Detlefs. 2016-09-22. X-ray Fourier ptychographic microscopy. https://arxiv.org/abs/1609.07513

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