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arXiv · 1611.05946

Greatly enhanced intensity-difference squeezing for narrow-band quantum metrology applications

Abstract

Narrow-band intensity-difference squeezing beams have important applications in quantum metrology and gravitational wave detection. The best way to generate narrow-band intensity-difference squeezing is to employ parametrically-amplified four-wave mixing process in high-gain atomic media. Such IDS can be further enhanced by cascading multiple parametrically-amplified four-wave mixing processes in separate atomic media. The complicated experimental setup, added losses and required high-power pump laser with the increase of number of stages can limit the wide uses of such scheme in practical applications. Here, we show that by modulating the internal energy level(s) with additional laser(s), the degree of original intensity-difference squeezing can be substantially increased. With an initial intensity-difference squeezing of $-8.5\pm0.4$ dB using parametrically-amplified-non-degenerate four-wave mixing process in a three-level $Λ$-type configuration, the degree of intensity-difference squeezing can be enhanced to $-11.9\pm0.4$ dB/$-13.9\pm0.4$ dB (corrected for losses) when we use one/two laser beam(s) to modulate the involved ground/excited state(s). More importantly, a maximal noise reduction of $-9.7\pm0.4$ dB (only corrected for electronic noise) is observed below the standard quantum limit, which is the strongest reported to date in phase insensitive amplification in four-wave mixing. Applying the model to quantum metrology, the signal-to-noise ratio is improved by 23 dB compared to the conventional Mach-Zehnder interferometer under the same phase-sensing intensity, which is a 14-fold enhancement in rms phase measurement sensitivity beyond the shot noise limit. Our results show a low-loss, robust and efficient way to produce high degree of IDS and facilitate its potential applications.

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Da Zhang, Changbiao Li, Zhaoyang Zhang, Feng Li, Yiqi Zhang, Yanpeng Zhang, Min Xiao. 2017-09-26. Greatly enhanced intensity-difference squeezing for narrow-band quantum metrology applications. https://doi.org/10.1103/physreva.96.043847

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