arXiv · 1708.07013
Characterization of the sub-micrometer hierarchy levels in the twist-bend nematic phase with nanometric helices via photopolymerization. Explanation for the sign reversal in the polar response
Abstract
Photo-polymerization of a reactive mesogen mixed with a mesogenic dimer, shown to exhibit the twist-bend nematic phase ($N_{TB}$), reveals the complex structure of the self-deformation patterns observed in planar cells. The polymerized reactive mesogen retains the structure formed by liquid crystalline molecules in the twist bend phase, thus enabling observation by Scanning Electron Microscope (SEM). Hierarchical ordering scales from tens of nanometers to micrometers are imaged in detail. Submicron features, anticipated from earlier X-ray experiments, are visualized directly. In the self-deformation stripes formed in the $N_{TB}$ phase, the average director field is found tilted in the cell plane by an angle of up to 45$^{\circ}$ from the cell rubbing direction. This tilting explains the sign inversion being observed in the electro-optical studies.
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Vitaly P. Panov, Sithara P. Sreenilayam, Yuri P. Panarin, Jagdish K. Vij, Chris J. Welch, Georg H. Mehl. 2017-08-23. Characterization of the sub-micrometer hierarchy levels in the twist-bend nematic phase with nanometric helices via photopolymerization. Explanation for the sign reversal in the polar response. https://doi.org/10.1021/acs.nanolett.7b03441
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