Search arXivSearch

arXiv · 1807.07114

Design of nano-scale high static performance phase-change on-off silicon photonic switch

Abstract

We report design of a high static performance on-off optical switch using nanoscale phase change material Ge2Sb2Te5 embedded into silicon-on-insulator waveguide. This active material can be switched between amorphous and crystalline states using electrical/optical pulses. The fundamental mode propagating through Silicon waveguide drastically alters its properties due to high index change at Si-Ge2Sb2Te5 interfaces and absorption in Ge2Sb2Te5. The optical switch made of Silicon waveguide with Ge2Sb2Te5 of volume 400 nm x 180 nm x 450 nm (length x height x width) embedded in to it, provides high extinction ratio of 43 dB with low insertion loss of 2.76 dB in ON state at communication wavelength of 1550 nm. There is trade-off between insertion loss and extinction ratio. For 10 dB extinction ratio, The insertion loss can be as low as 1.2 dB and corresponding active volume is also pretty low (100 nm x 150 nm x 450 nm (length x height x width)). Further, spectral response investigations reveal that this switch maintains extinction ratio more than 30 dB in wavelength span 1500-1600 nm. The high static performance of optical switch reported here is a direct result of proper dimensional engineering of active volume as well as its incorporation into the silicon-on-insulator waveguide. We also propose figure-of merit for non volatile optical switches that takes into account relevant parameters of static performance.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Nadir Ali, Rajesh Kumar. 2018-06-07. Design of nano-scale high static performance phase-change on-off silicon photonic switch. https://doi.org/10.1016/j.photonics.2018.10.007

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

Measuring vacancy-type defect density in monolayer semiconductors

Two-dimensional (2D) materials have attracted wide-spread interest due to their unique and tunable properties. Their optoelectronic, mechanical, and thermal properties are greatly influenced by crystal defects, which are, in turn, used to control these properties. However, experimental quantification of the density of defects, whether deliberately introduced or inherent, is very difficult in these atomically thin materials. Here we show that helium atom micro-diffraction can be used to measure the defect density in ~15x20um monolayer MoS2, a prototypical 2D semiconductor, quickly and easily compared to standard methods. We present a simple analytic model, the lattice gas equation, that captures the relationship between atomic Bragg diffraction intensity and defect density. The model, combined with ab initio scattering calculations, shows that our technique can immediately be applied to a wide range of 2D materials, independent of sample chemistry or structure. Additionally, wafer-scale characterization is immediately possible.

physics.app-ph

Compact Modeling of Oxide-Semiconductor, 2D Material, Carbon Nanotube, and Cryogenic Transistors with Experiment Verification

This paper presents a unified compact model for emerging transistor technologies, including oxide-semiconductor field-effect transistors (OSFETs), 2D material FETs (2DFETs), carbon nanotube FETs (CNFETs), and cryogenic MOSFETs. A unified charge-density formulation is developed to account for quantum confinement, trap charges, and band-tail states in channel charge calculations. A physics-based transport model is introduced to seamlessly capture carrier transport from the long-channel diffusive regime to the short-channel ballistic limit. Scaling models are incorporated to accurately describe 2D electrostatic effects. Cryogenic operation is modeled through the inclusion of band-tail states and temperature-dependent mobility and threshold voltage. The proposed model is validated against experimental data from the fabricated OSFETs with multiple channel lengths and published measurements of 2DFETs, CNFETs, and cryogenic MOSFETs. Excellent agreement is demonstrated across diverse device architectures, operating conditions, and material systems.

physics.app-ph

Multiplexing approaches to thermoradiative signatureless communications

Using mid-infrared emission from semiconductor devices for covert communications remains a relatively unexplored and yet promising opportunity. The phenomenon of negative luminescence allows for a method of signatureless covert communications where the net infrared emission of an emitting optoelectronic device is balanced to be identical to the ambient thermal background. In this work we provide a practical demonstration of covert data transfer over a thermoradiative channel with data rates up to 100 kbps. In addition, we demonstrate several additional multiplexing techniques that make the proposed thermoradiative communications method more secure against interception by achieving zero instantaneous optical emission, while remaining detectable if a sufficiently spatially or spectrally discerning observation is utilised. Finally, we discuss various application scenarios in which the proposed methods can be used to achieve secure signatureless communications.

physics.app-ph