Search arXivSearch

arXiv · 1811.03664

Increased dose rate precision in combined $α$ and $β$ counting in the $μ$Dose system - a probabilistic approach to data analysis

Abstract

The $μ$Dose system was developed to allow the measurement of environmental levels of natural radioactive isotopes. The system records $α$ and $β$ particles along with four decay pairs arising from subsequent decays of $^{214}$Bi/$^{214}$Po, $^{220}$Rn/$^{216}$Po, $^{212}$Bi/$^{212}$Po and $^{219}$Rn/$^{215}$Po. Under the assumption of secular equilibrium this allows to assess the specific radioactivities of $^{238}$U, $^{235}$U, $^{232}$Th decay chains and $^{40}$K. This assessment provides results with uncertainties which are correlated and, thus, require the development of an error estimation methodology which considers this issue. Here we present two different approaches for uncertainty propagation based on Monte Carlo and Bayesian methods. Both approaches produce statistically indistinguishable results and allow significantly better dose rate precision than when the correlations are not accounted for. In the given example, the dose rate precision is improved by a factor of two.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Konrad Tudyka, Andrzej Bluszcz, Grzegorz Poręba, Sebastian Miłosz, Grzegorz Adamiec, Aleksander Kolarczyk, Thomas Kolb, Johanna Lomax, Markus Fuchs. 2018-11-09. Increased dose rate precision in combined $α$ and $β$ counting in the $μ$Dose system - a probabilistic approach to data analysis. https://arxiv.org/abs/1811.03664

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

Development of an Extensible Unified Control System Using the STARS Framework and Common Commands for Detector Control

A zooming optical system comprising two Fresnel zone plates (FZPs) was developed and installed at the AR-NE1A beamline of the Photon Factory, High Energy Accelerator Research Organization (KEK), Japan. To ensure reliable and versatile operation, we implemented a dedicated control architecture based on the Simple Transmission and Retrieval System (STARS) framework and the newly proposed STARS Common Commands for Detector Control (CCDC)---a data-acquisition (DAQ) state model and command set designed specifically for detector control. The system serves both as a practical control system for the zooming optics and as a demonstration of modular extensibility using STARS and detector interoperability through CCDC. The system has been commissioned, and its performance has been verified at the AR-NE1A beamline. The architecture enables flexible configuration of optical components and provides a unified interface for both routine operation and advanced experimental protocols.

physics.ins-det

Agentic TCAD Calibration Workflow for Oxide Semiconductor Transistors

Experimental TCAD calibration is essential for predictive technology modeling of emerging oxide semiconductor transistors. However, it remains time-consuming and expert dependent because of model ambiguity. Multiple physical models and parameter sets can reproduce the same measured transfer characteristics, while local fitting alone cannot uniquely identify the underlying device physics. We present the first demonstration of an agentic TCAD calibration workflow for a fabricated bottom-gate In--W--O (BG-IWO) transistor. Starting from the measured transfer curve and device information, the workflow uses measurement--TCAD residuals and local sensitivity tests to select bounded parameter corrections or evaluate additional physical models, and accept only updates that improve device metrics. The LLM agent orchestrates the workflow, while Sentaurus governs the device physics. For the 2\%-W reference device, five agent-suggested updates yield a fixed calibrated model, reducing the multi-metric device objective $J$ by 14.3$\times$. Maximum $V_{\mathrm{th}}$/$I_{\mathrm{on}}$ errors are 36.1~mV/0.022 decade for varying-drain-bias tests and 46.2~mV/0.062 decade for varying-channel-length tests, demonstrating model transferability across bias and geometry rather than a local parameter fit. W-composition tests provide process-sensitive insight. This agentic workflow provides a faster route to model development for emerging device technologies.

physics.ins-det

Birefringence of AlGaAs/GaAs Coatings under Above-Band-Gap Illumination, GR Noise and Photo-Optic Transfer Function

AlGaAs/GaAs coatings are being considered as coating candidates for gravitational-wave detectors. In this paper we investigate the birefringence properties of this crystalline semiconductor material by modulating the optical illumination on the mirror coating and monitoring the induced birefringence. While the measured low-frequency birefringence values align with previous studies, we observed a frequency-dependent behavior in the illumination-to-birefringence coupling, characterized by a pole increasing with illumination intensity and a gain at zero frequency (DC gain) decreasing with illumination intensity. We developed a generic theoretical model based on a master equation to characterize the measurement results by considering photon-induced electric fields and electro-optic effects. This model can fit the frequency and intensity dependencies of the induced birefringence. Additionally, this model predicts a generation-recombination noise (GR noise) will be observable in the coating birefringence. While the presented measurement cannot predict the exact level of GR noise, for the frequency band and spot sizes relevant for gravitational-wave detectors we expect GR noise to be white below the pole frequency, scale with power the same way laser shot noise does, and for fixed power be independent of spot size.

physics.ins-det