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arXiv · 1812.01740

Time-resolved X-ray diffraction study of the structural dynamics in a ferroelectric thin film induced by sub-coercive fields

C. Kwamen·M. Rössle·W. Leitenberger·M. Alexe·M. Bargheer
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Abstract

The electric field-dependence of structural dynamics in a tetragonal ferroelectric lead zirconate titanate thin film is investigated under sub-coercive and above-coercive fields using time-resolved X-ray diffraction. During the application of an external field to the pre-poled thin film capacitor, structural signatures of domain nucleation and growth include broadening of the in-plane peak width of a Bragg reflection concomitant with a decrease of the peak intensity. This disordered domain state is remanent and can be erased with an appropriate voltage pulse sequence.

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C. Kwamen, M. Rössle, W. Leitenberger, M. Alexe, M. Bargheer. 2018-12-04. Time-resolved X-ray diffraction study of the structural dynamics in a ferroelectric thin film induced by sub-coercive fields. https://doi.org/10.1063/1.5084104

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