arXiv · 1901.11400
Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature
Abstract
Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.
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Joshua R. Smith, Rana X Adhikari, Katerin M. Aleman, Adrian Avila-Alvarez, Garilynn Billingsley, Amy Gleckl, Jazlyn Guerrero, Ashot Markosyan, Steven Penn, Juan A. Rocha, Dakota Rose, Robert Wright. 2019-01-29. Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature. https://arxiv.org/abs/1901.11400
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