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arXiv · 2002.05241

Runaway Electron Seed Formation at Reactor-Relevant Temperature

Abstract

Systematic variation of the pre-disruption core electron temperature (Te) from 1 to 12 keV using an internal transport barrier scenario reveals a dramatic increase in the production of seed runaway electrons (REs), ultimately accessing near-complete conversion of the pre-disruption current into sub-MeV RE current. Injected Ar pellets are observed to ablate more intensely and promptly as Te rises. At high Te, the observed ablation exceeds predictions from published thermal ablation models. Simultaneously, the thermal quench (TQ) is observed to significantly shorten with increasing Te -- a surprising result. While the reason for the shorter TQ is not yet understood, candidate mechanisms include: insufficiently accurate thermal ablation models, enhanced ablation driven by the seed RE population, or significant parallel heat transport along stochastic fields. Kinetic modeling that self-consistently treats the plasma cooling via radiation, the induced electric field, and the formation of the seed RE is performed. Including the combined effect of the inherent dependence of hot-tail RE seeding on Te together with the shortened TQ, modeling recovers the progression towards near-complete conversion of the pre-disruption current to RE current as Te rises. Measurement of the HXR spectrum during the early current quench (CQ) reveals a trend of decreasing energy with pre-disruption Te. At the very highest Te ($\approx$ 12 keV), $\approx$ 100% conversion of the thermal current to runaway current is found. The energy of this peculiar RE beam is inferred to be sub-MeV as it emits vanishingly few MeV hard X-rays (HXRs). These measurements demonstrate novel TQ dynamics as Te is varied and illustrate the limitations of treating the RE seed formation problem without considering the inter-related dependencies of the pellet ablation, radiative energy loss, and resultant variations of the TQ duration.

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C. Paz-Soldan, P. Aleynikov, E. M. Hollmann, A. Lvovskiy, I. Bykov, X. Du, N. W. Eidietis, D. Shiraki. 2020-02-12. Runaway Electron Seed Formation at Reactor-Relevant Temperature. https://doi.org/10.1088/1741-4326%2Fab7fe1

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