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arXiv · 2004.00802

Device-aware inference operations in SONOS nonvolatile memory arrays

Abstract

Non-volatile memory arrays can deploy pre-trained neural network models for edge inference. However, these systems are affected by device-level noise and retention issues. Here, we examine damage caused by these effects, introduce a mitigation strategy, and demonstrate its use in fabricated array of SONOS (Silicon-Oxide-Nitride-Oxide-Silicon) devices. On MNIST, fashion-MNIST, and CIFAR-10 tasks, our approach increases resilience to synaptic noise and drift. We also show strong performance can be realized with ADCs of 5-8 bits precision.

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BibTeXRIS

Christopher H. Bennett, T. Patrick Xiao, Ryan Dellana, Vineet Agrawal, Ben Feinberg, Venkatraman Prabhakar, Krishnaswamy Ramkumar, Long Hinh, Swatilekha Saha, Vijay Raghavan, Ramesh Chettuvetty, Sapan Agarwal, Matthew J. Marinella. 2020-04-02. Device-aware inference operations in SONOS nonvolatile memory arrays. https://arxiv.org/abs/2004.00802

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