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arXiv · 2004.10257

Characterizing TES Power Noise for Future Single Optical-Phonon and Infrared-Photon Detectors

C. W. Fink·S. L. Watkins·T. Aramaki·P. L. Brink·S. Ganjam·B. A. Hines·M. E. Huber·N. A. Kurinsky·R. Mahapatra·N. Mirabolfathi·W. A. Page·R. Partridge·M. Platt·M. Pyle·B. Sadoulet·B. Serfass·S. Zuber
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Abstract

In this letter, we present the performance of a $100~\mu\mathrm{m}\times 400~\mu\mathrm{m} \times 40~\mathrm{nm}$ tungsten (W) Transition-Edge Sensor (TES) with a critical temperature of 40 mK. This device has a measured noise equivalent power (NEP) of $1.5\times 10^{-18}\ \mathrm{W}/\sqrt{\mathrm{Hz}}$, in a bandwidth of $2.6$ kHz, indicating a resolution for Dirac delta energy depositions of $40\pm 5~\mathrm{meV}$ (rms). The performance demonstrated by this device is a critical step towards developing a $\mathcal{O}(100)~\mathrm{meV}$ threshold athermal phonon detectors for low-mass dark matter searches.

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C. W. Fink, S. L. Watkins, T. Aramaki, P. L. Brink, S. Ganjam, B. A. Hines, M. E. Huber, N. A. Kurinsky, R. Mahapatra, N. Mirabolfathi, W. A. Page, R. Partridge, M. Platt, M. Pyle, B. Sadoulet, B. Serfass, S. Zuber. 2020-04-21. Characterizing TES Power Noise for Future Single Optical-Phonon and Infrared-Photon Detectors. https://doi.org/10.1063/5.0011130

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