arXiv · 2104.08688
Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy
Abstract
Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.
Explore related subjects
Keep this discovery
Josh Kacher, Yao Xie, Sven P. Voigt, Shixiang Zhu, Henry Yuchi, Jordan Key, Surya R. Kalidindi. 2021-04-18. Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy. https://arxiv.org/abs/2104.08688
Cite the original work for its findings. Save a collection to share your selection of sources.