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arXiv · 2110.00573

Effects of nonmagnetic impurities and subgap states on the kinetic inductance, complex conductivity, quality factor and depairing current density

Abstract

We investigate how a combination of a nonmagnetic-impurity scattering rate $γ$ and finite subgap states parametrized by Dynes $Γ$ affects various physical quantities relevant to to superconducting devices: kinetic inductance $L_k$, complex conductivity $σ$, surface resistance $R_s$, quality factor $Q$, and depairing current density $J_d$. All the calculations are based on the Eilenberger formalism of the BCS theory. We assume the device materials are extreme type-II $s$-wave superconductors. It is well known that the optimum impurity concentration ($γ/Δ_0 \sim 1$) minimizes $R_s$. Here, $Δ_0$ is the pair potential for the idealized ($Γ\to 0$) superconductor for the temperature $T\to 0$. We find the optimum $Γ$ can also reduce $R_s$ by one order of magnitude for a clean superconductor ($γ/Δ_0 < 1$) and a few tens $\%$ for a dirty superconductor ($γ/Δ_0 > 1$). Also, we find a nearly-ideal ($Γ/Δ_0 \ll 1$) clean-limit superconductor exhibits a frequency-independent $R_s$ for a broad range of frequency $ω$, which can significantly improve $Q$ of a very compact cavity with a few tens of GHz frequency. As $Γ$ or $γ$ increases, the plateau disappears, and $R_s$ obeys the $ω^2$ dependence. The subgap-state-induced residual surface resistance $R_{\rm res}$ is also studied, which can be detected by an SRF-grade high-$Q$ 3D resonator. We calculate $L_k(γ, Γ,T)$ and $J_d(γ, Γ,T)$, which are monotonic increasing and decreasing functions of $(γ, Γ,T)$, respectively. Measurements of $(γ, Γ)$ of device materials can give helpful information on engineering $(γ, Γ)$ via materials processing, by which it would be possible to improve $Q$, engineer $L_k$, and ameliorate $J_d$.

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BibTeXRIS

Takayuki Kubo. 2021-10-01. Effects of nonmagnetic impurities and subgap states on the kinetic inductance, complex conductivity, quality factor and depairing current density. https://doi.org/10.1103/physrevapplied.17.014018

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