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arXiv · 2203.13625

Statistical analysis of hard X-ray radiation at PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry

Young Yong Kim·Ruslan Khubbutdinov·Jerome Carnis·Sangsoo Kim·Daewoong Nam·Inhyuk Nam·Gyujin Kim·Chi Hyun Shim·Haeryong Yang·Myunghoon Cho·Chang-Ki Min·Changbum Kim·Heung-Sik Kang·Ivan Vartanyants
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Abstract

Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at NCI beamline at 10 keV photon energy in various operation conditions: Self-Amplified Spontaneous Emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC, and 200 pC electron bunch charge, respectively. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on operation conditions. A high spatial degree of coherence of about 70-80% was determined in spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at PAL-XFEL facility.

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Young Yong Kim, Ruslan Khubbutdinov, Jerome Carnis, Sangsoo Kim, Daewoong Nam, Inhyuk Nam, Gyujin Kim, Chi Hyun Shim, Haeryong Yang, Myunghoon Cho, Chang-Ki Min, Changbum Kim, Heung-Sik Kang, Ivan Vartanyants. 2022-03-25. Statistical analysis of hard X-ray radiation at PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry. https://arxiv.org/abs/2203.13625

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