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arXiv · 2305.04785

Studying X-ray instruments with galaxy clusters

J. Nevalainen·S. Molendi
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Abstract

We applied a scientific approach to the problem of the effective area cross-calibration of the XMM-Newton EPIC instruments. Using a sample of galaxy clusters observed with the XMM-Newton EPIC, we quantified the effective area cross-calibration bias between the EPIC instruments as implemented in the public calibration data base on November 2021 in the 0.5-6.1 keV energy band. We invested significant efforts in controlling and minimising the systematic uncertainties of the cross-calibration bias below 1%. The statistical uncertainties are similar and thus we can reliably measure effects at 1% level. The effective area cross-calibration in the 0.5-6.1 keV band between MOS and pn is biased at a substantial level. The MOS/pn bias is systematic suggesting that MOS (pn) effective area may be calibrated too low (high), by $\sim$3-27% on average depending on the instrument and energy band. The excellent agreement of the energy dependencies (i.e. shapes) of the effective area of MOS2 and pn suggest that they are correctly calibrated within $\sim$1% in the 0.5-4.5 keV band. Comparison with an independent data set of point sources (3XMM) confirms this. The cluster sample indicates that the MOS1/pn effective area shape cross-calibration has an approximately linear bias amounting to $\sim$10% in maximum in the 0.5-4.5 keV band. The effective area cross-calibration of XMM-Newton/EPIC instruments on November 2021 in the 0.5-4.5 keV band is in a relatively good shape. However, the cluster-to-cluster rms scatter of the bias is substantial compared to the median bias itself. Thus, a statistically robust implementation of the cross-calibration uncertainties to a scientific analysis of XMM-Newton/EPIC data should include the propagation of the scatter to the best-fit parameters, instead of a simple average bias correction of the effective area.

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J. Nevalainen, S. Molendi. 2023-05-08. Studying X-ray instruments with galaxy clusters. https://arxiv.org/abs/2305.04785

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