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arXiv · 2401.15575

A High-Throughput Dark-Field Full-Field OCT System for Measuring Objects with Different Scattered Light Intensities

Youlong Fan·Qingye Hu·Zhongping Wang·Xiantao Wei·Zengming Zhang
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Abstract

Based on high-throughput dark-field full-field optical coherence tomography, we designed and built an OCT system that can measure a variety of samples with different scattered light intensities, such as materials with multi-layer structures, living biological tissues, etc. The system can obtain the backscattered light of samples to quickly generate the 2D cross-section image, 2D profile and 3D perspective of samples, and has the advantages of non-contact, non-damage, high image resolution and simple operation. At the same time, we also use average, four-phase cancellation and smooth step function to reduce noise, realize the measurement of finger epidermis and dermis and obtain their 3D perspective view. Sweat gland structures were observed in the dermis of the fingers. We also realized the non-destructive measurement of the kapoton tapes, photographed its 2D profile, and obtained its single channel waveform diagram on this basis, and completed the non-destructive and non-contact measurement of the multi-layer structure.

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Youlong Fan, Qingye Hu, Zhongping Wang, Xiantao Wei, Zengming Zhang. 2024-01-28. A High-Throughput Dark-Field Full-Field OCT System for Measuring Objects with Different Scattered Light Intensities. https://arxiv.org/abs/2401.15575

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