Search arXiv⌕ Search

arXiv · 2403.05639

A New Homogenization-Free Boundary Condition Towards Aperiodic Metasurface Design Using Full-Wave Surrogate Models of Printed Circuits

Abstract

A new homogenization-free boundary condition is introduced for the design of metasurfaces. The boundary condition, linking the tangential electric field to the induced surface current density within a unit cell, is described as a matrix equation containing a surrogate model of a printed circuit. Full-wave simulations are performed to construct the data needed to capture the physics of a printed circuits response to exciting fields in terms of its induced current density. The matrix equation takes the form of a boundary condition which can be included in design and optimization algorithms incorporating mutual coupling in the form of an impedance matrix. Modelling the metasurface in this manner allows for direct design of the realizable model avoiding any homogenization or locally periodic approximations leading to a paradigm shift in metasurface design approaches. The surrogate models construction is described and its use in a 50 printed circuit example is provided.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Jordan Budhu, Raphael Pestourie. 2024-03-08. A New Homogenization-Free Boundary Condition Towards Aperiodic Metasurface Design Using Full-Wave Surrogate Models of Printed Circuits. https://arxiv.org/abs/2403.05639

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

Thermoreflectance-Based Techniques for Micro- and Nanoscale Thermophysical Property Measurements: Principles, Methods, and Recent Advances

As semiconductor devices shrink toward the nanoscale, heat transport and thermal-energy-storage behavior in materials and interfaces become increasingly dependent on length scale, structure, and interfaces. Accurate characterization of thermophysical properties, including thermal conductivity, interfacial thermal conductance, and volumetric heat capacity, is therefore essential for functional-material design and thermal management of advanced electronic devices. Photothermal thermoreflectance techniques provide noncontact measurements with high spatial and temporal resolution and a broad measurement range, making them important tools for micro- and nanoscale thermophysical characterization. This review examines the physical principles and technical characteristics of transient thermoreflectance (TTR), time-domain thermoreflectance (TDTR), frequency-domain thermoreflectance (FDTR), steady-state thermoreflectance (SSTR), spatial-domain thermoreflectance (SDTR), and the square-pulsed source (SPS) method. A unified heat-diffusion framework is established to compare these methods in terms of parameter sensitivity, measurement uncertainty, and applicability. Representative applications illustrate their suitability for low-thermal-conductivity materials, anisotropic films, crystalline materials, and multilayer heterostructures, as well as their complementary capabilities for characterizing thin-film thermal conductivity, interfacial thermal conductance, and in-plane/cross-plane heat transport. Finally, emerging directions are discussed, including ultrahigh spatiotemporal resolution, multiphysics coupling, in-line industrial inspection, intelligent data processing, and natural-language-driven analysis.

physics.app-ph↗

Janus Dipoles: Fundamentals, Realizations, and Emerging Applications

The Janus dipole - featuring orthogonally oriented electric and magnetic dipoles with a 90-degree phase difference - has emerged as a powerful paradigm for wave manipulation. Unlike traditional Huygens dipoles used for directional control, this unique configuration exhibits strongly asymmetric, face-selective near-field behavior while maintaining a quasi-isotropic far-field radiation pattern. These remarkable properties make the Janus dipole an essential platform for directional wave shaping, with wide-ranging applications in on-chip photonics, quantum interactions, and wireless power transfer. This review systematically traces the rapid development of the Janus dipole from its foundational theoretical inception to its diverse implementation platforms across optical, microwave, and acoustic frequencies. In this paper, we explore the governing principles, classify realization strategies into passive Janus dipoles, active Janus dipoles, and advanced near-field coupling control, and highlight emerging frontiers. By bridging foundational electrodynamics with advanced device engineering, this paper serves as an essential reference and roadmap for researchers designing next-generation, highly integrated, and compact wave-manipulation systems.

physics.app-ph↗

Evaluation of effective wave velocities in polycrystalline materials using the ultrasonic reflection matrix

In-depth characterization of heterogeneous materials has long been a challenge in non-destructive testing. Here, a method is proposed to determine the elastic constants of metallic polycrystalline materials using back-scattered ultrasound. The waves scattered by the microstructure are analyzed to image the effective bulk velocities. To this end, a reflection matrix is acquired with an array of transducers. The projection of this matrix onto a focused basis is used to estimate an average point spread function. Optimizing this function with respect to the propagation model leads to an estimation of the longitudinal velocity. Additional treatments are developed to adapt the method to map the shear wave velocity. The local Poisson's ratio is then deduced from the ratio between those two velocities. Young's modulus and shear modulus can also be obtained assuming known densities. This matrix approach is experimentally validated on different polycrystalline materials. A sample displaying heterogeneous mechanical properties is then simulated to assess the accuracy and the resolution of the method. Its strengths and limitations are discussed, demonstrating its potential for quantitative non-destructive material characterization.

physics.app-ph↗