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arXiv · 2406.12940

Measurement of exciton fraction of microcavity exciton-polaritons using transfer-matrix modeling

Jonathan Beaumariage·Zheng Sun·Hassan Alnatah·Qi Yao·David M. Myers·Mark Steger·Ken West·Kirk Baldwin·Loren N. Pfeiffer·Man Chun Alan Tam·Zbig R. Wailewski·David W. Snoke
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Abstract

We present a careful calibration of the exciton fraction of polaritons in high-$Q$ ($\sim 300,000$), long-lifetime ($\sim 300$ ps), GaAs/AlGaAs microcavities.This is a crucial parameter for many-body theories which include the polariton-polariton interactions.It is much harder to establish this number in high-$Q$ structures compared to low-$Q$ structures, because the upper polariton is nearly invisible in high-$Q$ cavities.We present a combination of photoluminescence, photoluminescence excitation, and reflectivity measurements to highly constrain the fit model, and compare the results of this model to the results from low-$Q$ structures.We present a fitted curve of exciton fraction as a function of the lower polariton energy for multiple samples which have been used in prior experiments.

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Jonathan Beaumariage, Zheng Sun, Hassan Alnatah, Qi Yao, David M. Myers, Mark Steger, Ken West, Kirk Baldwin, Loren N. Pfeiffer, Man Chun Alan Tam, Zbig R. Wailewski, David W. Snoke. 2024-06-17. Measurement of exciton fraction of microcavity exciton-polaritons using transfer-matrix modeling. https://arxiv.org/abs/2406.12940

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