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arXiv · 2409.11207

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Johannes Hoffmann·Sophie de Preville·Bruno Eckmann·Hung-Ju Lin·Benedikt Herzog·Kamel Haddadi·Didier Theron·Georg Gramse·Damien Richert·Jose Moran-Meza·Francois Piquemal
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Abstract

In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens.

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Johannes Hoffmann, Sophie de Preville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Theron, Georg Gramse, Damien Richert, Jose Moran-Meza, Francois Piquemal. 2024-09-17. Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. https://doi.org/10.1109/tim.2024.3378310

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