Benchmarking low-power flopping-mode spin qubit fidelities in Si/SiGe devices with alloy disorder

Abstract

In the "flopping-mode" regime of electron spin resonance, a single electron confined in a double quantum dot is electrically driven in the presence of a magnetic field gradient. The increased dipole moment of the charge in the flopping mode significantly reduces the amount of power required to drive spin rotations. However, the susceptibility of flopping-mode spin qubits to charge noise, and consequently their overall performance, has not been examined in detail. In this work, we simulate single-qubit gate fidelities of electrically driven spin rotations in an ensemble of devices configured to operate in both the single-dot and flopping-mode regimes. Our model accounts for the valley physics of conduction band electrons in silicon and realistic alloy disorder in the SiGe barrier layers, allowing us to investigate device-to-device variability. We include charge and magnetic noise, as well as spin relaxation processes arising from charge noise and electron-phonon coupling. We find that the two operating modes exhibit significantly different susceptibilities to the various noise sources, with valley splitting and spin relaxation times also playing a role in their relative performance. For realistic noise strengths, we find that single-dot gate fidelities are limited by magnetic noise while flopping-mode fidelities are primarily limited by charge noise and spin relaxation. For sufficiently long spin relaxation times, flopping-mode spin operation is feasible with orders-of-magnitude lower drive power and gate fidelities that are on par with conventional single-dot electric dipole spin resonance.