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arXiv · 2603.09461

Recent application studies of an INTPIX4NA SOIPIX detector-based X-ray camera using an SiTCP-XG 10GbE-based high-speed readout system at KEK facilities

Ryutaro Nishimura·Noriyuki Igarashi·Daisuke Wakabayashi·Yuki Shibazaki·Yoshio Suzuki·Keiichi Hirano·Hiromi Miki·Akio Yoneyama·Hiroshi Sugiyama·Kazuyuki Hyodo·Izumi Umegaki·Koichiro Shimomura·Yasuo Arai
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Abstract

The Silicon-On-Insulator PIXel (SOIPIX) detector is a unique monolithic structure imaging device currently being developed by the SOIPIX group, led by the High Energy Accelerator Research Organization (KEK). Our detector team at the KEK Photon Factory (PF) has developed an X-ray camera based on the INTPIX4NA SOIPIX detector. This detector provides a sensitive area of 14.1 $\times$ 8.7 $\mathrm{mm^2}$, with 425,984 pixels arranged in an 832-column $\times$ 512-row matrix and a pixel size of 17 $\times$ 17 $\mathrm{μm^{2}}$, and offers high spatial resolution and excellent sensitivity under low-intensity X-ray conditions. The readout system used in the X-ray camera is developed at the PF. It is equipped with SiTCP-XG, a 10 Gb Ethernet network controller implemented on a field-programmable gate array, enabling high-frame-rate imaging at several hundred hertz. We are currently investigating the applicability of this X-ray camera in several experiments at KEK. Herein, we report three recent application studies: (1) X-ray zooming microscope optics using two Fresnel zone plates at PF AR-NE1A; (2) phase-contrast X-ray imaging system using a two-crystal X-ray interferometer at PF BL-14C; and (3) nondestructive lithium detection in Li-ion battery electrode materials using muonic X-rays at J-PARC MLF Muon D2.

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Ryutaro Nishimura, Noriyuki Igarashi, Daisuke Wakabayashi, Yuki Shibazaki, Yoshio Suzuki, Keiichi Hirano, Hiromi Miki, Akio Yoneyama, Hiroshi Sugiyama, Kazuyuki Hyodo, Izumi Umegaki, Koichiro Shimomura, Yasuo Arai. 2026-06-06. Recent application studies of an INTPIX4NA SOIPIX detector-based X-ray camera using an SiTCP-XG 10GbE-based high-speed readout system at KEK facilities. https://doi.org/10.1016/j.nima.2026.171861

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