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arXiv · 2608.05888

An Open-Source Power Measurement Platform for System-Level Semiconductor Testing

Abstract

Accurate power measurement is not only essential for evaluating the energy efficiency of modern embedded and semiconductor systems, but power draw is an important proxy during stress testing. Industrial semiconductor test equipment, however, is often expensive and difficult to integrate into flexible experimental workflows. This paper presents a compact and extensible hardware platform for automated system-level power measurement of embedded devices. The proposed setup integrates a Raspberry Pi controller, a precision current measurement device, and a microcontroller-based Device-under-Test (DUT). The system supports automated firmware deployment, synchronized device execution, and high-resolution current acquisition. A lightweight HTTP-based interface allows remote clients to upload firmware binaries and retrieve measurement results. This design enables automated benchmarking and reproducible experiments across multiple firmware variants. The platform is implemented using accessible hardware components and open-source software tools, making it suitable for research, prototyping, and educational environments. We describe the architecture of the platform, the automated testing workflow, and potential application scenarios, including firmware energy profiling and regression testing.

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Linus Bantel, Sarah Rottacker, Dirk Pflüger. 2026-08-06. An Open-Source Power Measurement Platform for System-Level Semiconductor Testing. https://arxiv.org/abs/2608.05888

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