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arXiv · 2608.09466

Second order unfitted ghost-FEM for elliptic interface problems with applications to low-dimensional semiconductor devices

Clarissa Astuto·Giovanni Nastasi
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Abstract

We develop an unfitted ghost finite element method for elliptic interface problems with discontinuous diffusion coefficients and apply it to the electrostatic simulation of low-dimensional semiconductor devices. The proposed approach is based on a fixed Cartesian grid and represents the geometry by level-set functions, avoiding mesh generation and remeshing even in the presence of interfaces. A snapping-back-to-grid strategy is used to control the small-cut-cell issue, while interface conditions are weakly enforced by a symmetric Nitsche formulation. The method is first validated on benchmark elliptic interface problems with different geometries and coefficient jumps, showing second-order accuracy for the solution and first-order accuracy for its gradient. As an application, we consider a graphene field-effect transistor described by a self-consistent drift-diffusion-Poisson model. The electrostatic potential is computed in a two-dimensional oxide/graphene/oxide structure, while charge transport in the graphene layer is modeled by one-dimensional bipolar drift-diffusion equations in the degenerate case and by including a field-dependent mobility model. The coupled nonlinear system is solved by a damped fixed-point iteration combined with a domain-decomposition treatment of the three-layer geometry. Numerical simulations reproduce transfer characteristics with a clear transition from an OFF state to an ON state and show the influence of the gate voltage on the two-dimensional electrostatic potential. The results also indicate that the effective thickness and discretization of the graphene layer affect the transverse potential profile, supporting the use of a full two-dimensional electrostatic description with explicit oxide/graphene interface conditions.

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Clarissa Astuto, Giovanni Nastasi. 2026-08-10. Second order unfitted ghost-FEM for elliptic interface problems with applications to low-dimensional semiconductor devices. https://arxiv.org/abs/2608.09466

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