Josephson transport in YBa${}_{2}$Cu${}_{3}$O${}_{7}$ weak links created by focused-helium-ion-beam irradiation: Analysis based on diffusive-SNS-junction model

Abstract

Fabrication of YBCO weak links by focused helium ion beam irradiation is a promising approach for realizing high-temperature superconducting Josephson junction devices. Although empirical dose-characteristic relationships have been established, the underlying transport mechanisms remain unclear. In this study, we perform a detailed investigation of the transport properties of YBCO weak links fabricated using a helium ion microscope (HIM) and provide a unified phenomenological description of the observed behavior based on the theory of SNS junctions with a diffusive metallic interlayer. We demonstrate that the temperature dependence of the critical current $I_{\mathrm{c}}$ and the $I_{\mathrm{c}}R_{\mathrm{n}}$ product are well described by diffusive SNS junction models over a wide temperature range. Analyses show that the observed dose dependences of $I_{\mathrm{c}}$ and $I_{\mathrm{c}}R_{\mathrm{n}}$ cannot be explained solely by variations in the effective Thouless energy $E_{\mathrm{T}}$. The discrepancy suggests reduced interface transparency and a reduction in the density of states, leading to a decrease in the effective number of conducting channels contributing to transport. This interpretation is also consistent with the observed exponential increase in $R_{\mathrm{n}}$ with irradiation dose. These results provide a diffusion-based framework for understanding Josephson transport and guiding junction design in helium-ion-irradiated YBCO weak links.