Search arXivSearch

arXiv · 2608.27753

What Can Low Resource Languages Learn From Each Other?

Abstract

Despite the rapid advancement of Vision-Language Models (VLMs), their linguistic reach remains largely confined to high-resource languages, leaving the majority of the world's 7,000+ living languages on the wrong side of a growing digital divide. This disparity is especially pronounced in Optical Character Recognition (OCR), where low-resource scripts lack the massive datasets required for traditional scaling laws. We investigate OCR adaptation in extreme data-scarce regimes (<10K real and <250K synthetic images), demonstrating that conventional fine-tuning strategies often reach a performance ceiling. Our key finding reveals a structural inefficiency in language-specific adaptation: while higher layers of specialized models diverge to capture unique script nuances, the lower layers learn redundant, highly similar features. Motivated by this observation, we propose PSMC (Pre-train, Specialize, Merge, and Co-train), a data-efficient framework that capitalizes on a cross-script "transfer effect". Our approach first derives language-specific experts from a high-resource base model, then employs task arithmetic to fuse these experts into a unified, high-performance multilingual back- bone. Extensive evaluation across 10 Indian scripts (supporting 20+ languages) shows that PSMC achieves a ~2% average improvement in Word Recognition Rate (WRR) over individual specialist models without increasing parameter count. Our results indicate that joint training in the merged latent space facilitates a constructive knowledge transfer that benefits all constituent scripts, providing a scalable pathway for inclusive VLM development. Source code and datasets will be released post publication.

Explore related subjects

Keep this discovery

BibTeXRIS

Achyuth P, Kahaan Shah, Chetan Arora. 2026-08-27. What Can Low Resource Languages Learn From Each Other?. https://arxiv.org/abs/2608.27753

Cite the original work for its findings. Save a collection to share your selection of sources.

Discover connections

Connections use source metadata and explicit phrase matches, not verified experimental comparisons.

KEEP EXPLORING

Related discoveries

Texture Image Classification Using DWT AlexNet Feature Fusion and Deep Neural Networks

Texture image classification plays a significant role in computer vision applications, including industrial inspection, medical image analysis, remote sensing, and object recognition. Handcrafted features can capture local texture characteristics but may have limited capability to represent complex visual patterns. In contrast, deep learning models automatically learn discriminative representations but may not fully exploit the multiscale spatial-frequency information inherent in texture images. This paper proposes a hybrid feature fusion framework, termed DWT_AlexNet_DNN, which combines Discrete Wavelet Transform (DWT) features with deep features extracted using AlexNet for texture image classification.

cs.CV

GeBDA: Building Damage Assessment as Text-Based Sequence Prediction

Conventionally, Building Damage Assessment (BDA) is tackled either with dedicated network architectures or by fine-tuning geospatial image foundation models. In this work, we ask whether a general-purpose Vision-Language Model (VLM) can localize buildings and grade their damage through autoregressive sequence generation alone. We cast BDA as predicting a variable-length set of bounding boxes, each specified by its coordinates and a damage label. Our preliminary implementation, based on the open Gemma model, achieves promising damage mapping results from only bi-temporal satellite images and a suitable text prompt.

cs.CV

SePArate: Segmenting Patterns from Defects in Wafer Manufacturing Using Weak Supervision

In semiconductor manufacturing, defect analysis is essential, but manual inspection cannot scale. However, existing automated inspection methods remain insufficient for root-cause analysis and process optimization. To this end, we present SePArate, a weakly supervised wafer defect segmentation method. SePArate enables pixel-level separation of patterns by leveraging only image-level annotations. It consists of a three-phase training: encoder pretraining, knowledge transfer to learn spatial cues, and training on synthetic mixed-defect data for accurate segmentation. Experiments demonstrate that SePArate outperforms the baselines.

cs.CV