Robust Device-Independent Certification of Boolean-Phase Gates

Abstract

Device-independent certification of a quantum gate requires the input and output tests to identify the same reference qubits. Self-testing the output Choi state alone does not guarantee this consistency. We develop a robust certification scheme for Boolean-phase gates, a broad family of computational-basis diagonal gates specified by Boolean functions. Boolean derivatives convert the target-dependent phase information into classical signs that can be evaluated from local measurement outcomes. This leads to Bell tests built from CHSH blocks using two binary measurements per party and no entangling measurements. At maximal violation, the tests self-test the normalized Choi state and the measured observables. Away from the maximum, they give an explicit affine lower bound on the extracted-state squared fidelity that is uniform over all Boolean functions and valid in arbitrary local dimensions. We then combine an identity test and a gate-output test in an independent-source network in which the reference devices use the same physical observables, obtaining a closed-form Choi-fidelity bound for an effective \(n\)-qubit channel. For CCZ, a joint six-party analysis gives a stronger robustness bound without changing the Bell expression or measurement settings. The construction shows how the algebraic structure of a gate can shift target-dependent information from quantum measurement design to classical processing of local outcomes.