Frequency-swept Brillouin spectroscopy

Abstract

Spontaneous Brillouin microscopy provides non-contact access to the viscoelastic properties of materials. Standard measurements typically utilize a single-wavelength continuous-wave laser to illuminate a specimen and excites a spontaneous Brillouin scattering signal, which is then recorded by a spectrometer. Existing Brillouin spectrometers are mostly built around either a scanning Fabry-Pérot etalon or a virtually imaged phased array (VIPA) etalon. While performing well, these setups are bulky and demand significant optical expertise to construct and maintain. Here, we propose a new approach to conducting Brillouin spectroscopy. In this approach, a frequency-swept laser excites a series of Brillouin spectra with incrementally shifted central frequencies, while a frequency picker, consisting of a narrow bandpass filter and a highly sensitive single-photon detector, sequentially records each spectral component to reconstruct the full spectrum. We demonstrate that the frequency-swept Brillouin spectroscopy can run under shot-noise limited condition using standard samples. Compared with conventional spectrometers, our system features a much more compact design for portable applications and holds potential for rapid mechanical imaging through multiplexing.