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arXiv · 2610.19304

Leakage benchmarking with decohering subgroups in the presence of preparation and measurement errors

Abstract

A common problem with physical qubits is that the state can leak outside the computational subspace. To characterize the problem, it is desirable to measure both the leakage probability and the fidelity of gates inside the computational subspace. Randomized benchmarking is a readily accessible method for estimating average gate fidelities and can be modified to account for leakage. However, in the presence of state preparation and measurement errors (SPAM) there are parameter degeneracies, and fidelities and leakage become underdetermined. We study the example of qudits with any number of leakage levels under the assumption of gate-independent noise. We show that randomized benchmarking sequences with leakage level decoherence can be analyzed as a Markov process with noisy classical preparations and measurements. This result generalizes to randomized benchmarking with random gates from an arbitrary group that contains a phase-decohering subgroup. We characterize the parameter degeneracy in inferring the Markov process, preparations and measurements. Based on this characterization we develop a measurement and inference method taking advantage of known conservative bounds on SPAM to constrain fidelity, leakage and other parameters of the Markov process, state preparations and measurements. As part of our study, we experimentally implemented the measurement method for a qubit defined on the one-excitation subspace of two transmons, for which there are two leakage levels. We determined confidence intervals accounting for parameter degeneracy for a number of performance parameters of the system. For leakage and fidelity, we compare these intervals to those obtained for several conventional methods for leakage benchmarking.

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BibTeXRIS

Shawn Geller, Tongyu Zhao, Alex Kwiatkowski, Scott Glancy, Raymond W. Simmonds, Emanuel Knill. 2026-10-13. Leakage benchmarking with decohering subgroups in the presence of preparation and measurement errors. https://arxiv.org/abs/2610.19304

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