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arXiv · 2610.24480

RiSE: Residual Subspace Expert for Generalizable Text-Centric Image Forgery Localization

Abstract

As AI-assisted image editing becomes increasingly prevalent, Text-Centric Image Forgery Localization (TFL) is essential for protecting trust in financial and legal records. However, we observe that existing TFL detectors predominantly rely on Full-Parameter Fine-Tuning (FPFT) and fail to generalize to unseen forgery types because FPFT can induce low-rank feature collapse and overfit training artifacts. Meanwhile, prior detectors capture diverse forgery traces with a single unified representation, making subtle traces entangled and difficult to learn. To address these challenges, we propose RiSE, a Residual Subspace Expert model that preserves pre-trained priors by freezing principal SVD components and adapting only the residual subspaces with a ViT-only segmentor to avoid feature collapse. RiSE introduces forgery-aware residual experts, where each expert is trained independently on a training subset with a particular forgery type, and we show that cross-domain localization performance improves consistently as more experts are added. At inference, we introduce Latent Perturbation Confidence (LPC), which selects the most confident expert by analytically computing the latent-perturbed output. LPC enables efficient confidence estimation with a single forward pass, avoiding repeated forward passes on perturbed samples and improving expert selection. By training on synthetic forgery data, RiSE with 1 expert outperforms prior methods on real-world forgery images by 20.4% while reducing training steps by 10 times. Scaling the number of experts to 9 yields a 35.8% gain. RiSE remains effective with DCT feature, even when the majority of the parameters is frozen with RGB-only pretraining. Code: https://github.com/KahimWong/RiSE.

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BibTeXRIS

Kahim Wong, Kemou Li, Yiming Chen, Haiwei Wu, Jiantao Zhou. 2026-10-17. RiSE: Residual Subspace Expert for Generalizable Text-Centric Image Forgery Localization. https://arxiv.org/abs/2610.24480

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