arXiv · 2610.32711
Beyond Hotness: High-Resolution Memory Characterization of Cloud and LLM Workloads for Tiered Memory with ARM SPE
Abstract
Memory demands from data analytics and LLM workloads grow rapidly, driving up memory costs in cloud and data centers. Multi-tier memory has emerged as a promising solution to balance performance and cost. However, effectively leveraging it requires a deep understanding of workload memory behaviors. This work introduces a high-resolution memory characterization methodology for analyzing workload-specific opportunities for multi-tier memory usage. In response to the increasing deployment of ARM-based processors in data centers, we implement our methodology using the recent Statistical Profiling Extension (SPE) for ARM. By characterizing eight memory-intensive workloads from CloudSuite and LLM applications, we identify region-specific access patterns, evaluate the effectiveness of cloud-oriented cache hierarchies, and propose new metrics based on memory idle periods and latency profiles to determine suitable data placement for tiered memory.
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Jie Ren, Ivy Peng. 2026-10-23. Beyond Hotness: High-Resolution Memory Characterization of Cloud and LLM Workloads for Tiered Memory with ARM SPE. https://arxiv.org/abs/2610.32711
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