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arXiv · 2610.38345

Quantum change point metrology

Xu Chen·Xue Ma
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Abstract

We quantify the extra Bayes risk of locating a quantum change point and estimating its amplitude with one measurement. The joint and marginal optimizations use the full record and the same joint prior, with both parameters unknown. For product records on a known pure state curve, position has clipped absolute loss in resolution units, and amplitude offset has squared loss in fixed calibrated units. Ideal steps exhibit certified conflict at finite signal strength, including in phase records of sixteen qubits, and recover both informative marginal optima at strong signal. For finite offset prior width, a retained quantum boundary region serves position, and the remaining suffix serves amplitude. Physical recovery holds when strength grows more slowly than the square root of record length. Known smooth rises also admit leading recovery in the coherent experiment as strength grows and width shrinks. For the quintic profile, we establish two residual cost scaling laws. The residual cost is $Θ(s^{-2})$ as $s\to\infty$. Taking the strong signal limit at fixed $w$ yields a limiting cost of $Θ(w^3)$ as $w\to0$. In the resolved local model, quadratic position loss admits a common optimum within the covariant class. These results link onset geometry and decision loss to Bayesian measurement compatibility in quantum change point estimation.

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Xu Chen, Xue Ma. 2026-10-28. Quantum change point metrology. https://arxiv.org/abs/2610.38345

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