arXiv · cond-mat/9812183
Maximum Metallic Conductivity in Si-MOS Structures
Abstract
We found that the conductivity of the two-dimensional electron system in Si-MOS structures is limited to a maximum value, G_{max}, as either density increases or temperature decreases. This value G_{max} is weakly disorder dependent and ranging from 100 to 140 e^2/h for samples whose mobilities differ by a factor of 4.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
V. M. Pudalov, G. Brunthaler, A. Prinz, G. Bauer. 1998-12-23. Maximum Metallic Conductivity in Si-MOS Structures. https://doi.org/10.1103/physrevb.60.r2154
Cite the original work for its findings. Save a collection to share your selection of sources.