Status of a DEPFET pixel system for the ILC vertex detector

M. Trimpl; M. Koch; R. Kohrs; H. Krueger; P. Lodomez; L. Reuen; C. Sandow; E. v. Toerne; J. J. Velthuis; N. Wermes; L. Andricek; H. G. Moser; R. H. Richter; G. Lutz; F. Giesen; P. Fischer; I. Peric

doi:10.1016/j.nima.2005.11.204

arXiv · physics/0606104

Status of a DEPFET pixel system for the ILC vertex detector

M. Trimpl·M. Koch·R. Kohrs·H. Krueger·P. Lodomez·L. Reuen·C. Sandow·E. v. Toerne·J. J. Velthuis·N. Wermes·L. Andricek·H. G. Moser·R. H. Richter·G. Lutz·F. Giesen·P. Fischer·I. Peric

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Abstract

We have developed a prototype system for the ILC vertex detector based on DEPFET pixels. The system operates a 128x64 matrix (with ~35x25 square micron large pixels) and uses two dedicated microchips, the SWITCHER II chip for matrix steering and the CURO II chip for readout. The system development has been driven by the final ILC requirements which above all demand a detector thinned to 50 micron and a row wise read out with line rates of 20MHz and more. The targeted noise performance for the DEPFET technology is in the range of ENC=100 e-. The functionality of the system has been demonstrated using different radioactive sources in an energy range from 6 to 40keV. In recent test beam experiments using 6GeV electrons, a signal-to-noise ratio of S/N~120 has been achieved with present sensors being 450 micron thick. For improved DEPFET systems using 50 micron thin sensors in future, a signal-to-noise of 40 is expected.

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M. Trimpl, M. Koch, R. Kohrs, H. Krueger, P. Lodomez, L. Reuen, C. Sandow, E. v. Toerne, J. J. Velthuis, N. Wermes, L. Andricek, H. G. Moser, R. H. Richter, G. Lutz, F. Giesen, P. Fischer, I. Peric. 2006-12-07. Status of a DEPFET pixel system for the ILC vertex detector. https://doi.org/10.1016/j.nima.2005.11.204

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