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Vibrating Wire for Beam Profile Scanning

S. G. Arutunian·N. M. Dobrovolski·M. R. Mailian·I. G. Sinenko·I. E. Vasiniuk
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Abstract

The method for measurement of transverse profile (emittance) of the bunch by detecting of radiation arising scattering at of the bunch on the scanning wire is wide-spread. In this work the information about scattering bunch is proposed to measure using the oscillation frequency of the tightened scanning wire. In such way the system of radiation (or secondary particles) extraction and measurement can be removed. Dependence of oscillations frequency on beam scattering is determined by several factors, including changes of wire tension caused by transverse force of the beam, influence of beam self field. Preliminary calculations show that influence caused by wire heating will dominate. We have studied strain gauges on the basis of vibrating wire from various materials (tungsten, beryl bronze, niobium zirconium alloys). A scheme of self oscillations generation by alternating current in autogeneration circuit with automatic frequency adjustment was selected. Special method of wire fixation and elimination of transverse degrees of freedom allow to achieve relative stability better than 1E-5 during several days. For a tungsten wire with a fixed end dependence of frequency on temperature was 1E-5/K. Experimental results and estimates of wire heating of existing scanners show, that the wire heats up to a few hundred grades, which is enough for measurements.

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S. G. Arutunian, N. M. Dobrovolski, M. R. Mailian, I. G. Sinenko, I. E. Vasiniuk. 1999-01-26. Vibrating Wire for Beam Profile Scanning. https://doi.org/10.1103/physrevstab.2.122801

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