arXiv subjects

Aleksander Labuda

Publications and source records attributed to Aleksander Labuda.

5 recordsLinked to original sources

arXiv2025

Lateral force microscopy calibration using an interferometric atomic force microscope

A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented automatically and performed with minimal user input. The microscope has the capability to measure the probe tip height in situ, which allows for a complete lateral force calibration without changing the sample or probe. Two options for lateral force measurements are described wherein the two detectors are alternately used to measure normal and lateral forces, and methods for applying the calibration protocol for both alternatives are provided. The tip height measurement is validated by direct comparison with an electron micrograph and they are generally in agreement to within 1.4 microns. For most cantilevers tested, the complete lateral calibration method is consistent with the wedge calibration method to within the intrinsic uncertainty of the wedge method.

cond-mat.mes-hall↗

arXiv2017

Robust and Efficient Parametric Spectral Estimation in Atomic Force Microscopy

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics, and cell biology. Prior to a given experiment, the AFM must be calibrated by fitting a spectral density model to baseline recordings. However, since AFM experiments typically collect large amounts of data, parameter estimation by maximum likelihood can be prohibitively expensive. Thus, practitioners routinely employ a much faster least-squares estimation method, at the cost of substantially reduced statistical efficiency. Additionally, AFM data is often contaminated by periodic electronic noise, to which parameter estimates are highly sensitive. This article proposes a two-stage estimator to address these issues. Preliminary parameter estimates are first obtained by a variance-stabilizing procedure, by which the simplicity of least-squares combines with the efficiency of maximum likelihood. A test for spectral periodicities then eliminates high-impact outliers, considerably and robustly protecting the second-stage estimator from the effects of electronic noise. Simulation and experimental results indicate that a two- to ten-fold reduction in mean squared error can be expected by applying our methodology.

stat.AP↗

arXiv2017

Fast, High Resolution and Wide Modulus Range Nanomechanical Mapping with Bimodal Tapping Mode

Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use, quantification of tip-sample mechanical properties such as stiffness has remained elusive. Bimodal tapping mode keeps the advantages of single-frequency tapping mode while extending the technique by driving and measuring an additional resonant mode of the cantilever. The simultaneously measured observables of this additional resonance provide the additional information necessary to extract quantitative nanomechanical information about the tip-sample mechanics. Specifically, driving the higher cantilever resonance in a frequency modulated (FM) mode allows direct measurement of the tip-sample interaction stiffness and, with appropriate modeling, the setpoint-independent local elastic modulus. Here we discuss the advantages of bimodal tapping, coined AM-FM imaging, for modulus mapping. Results are presented for samples over a wide modulus range, from a compliant gel (~100 MPa) to stiff materials (~100 GPa), with the same type of cantilever. We also show high-resolution (sub-nanometer) stiffness mapping of individual molecules in semi-crystalline polymers and of DNA in fluid. Combined with the ability to remain quantitative even at line scan rates of nearly 40 Hz, the results demonstrate the versatility of AM-FM imaging for nanomechanical characterization in a wide range of applications.

cond-mat.mes-hall↗

arXiv2016

Calibration of higher eigenmodes of cantilevers

A method is presented for calibrating the higher eigenmodes (resonance modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine the power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonance frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating higher-mode stiffnesses are reported for three popular multifrequency cantilevers. Once the higher-mode stiffnesses are known, the amplitude of each mode can also be calibrated from the thermal spectrum by application of the equipartition theorem.

cond-mat.mes-hall↗

arXiv2014

Photothermally Excited Contact Resonance Imaging in Air and Water

Contact Resonance Force Microscopy (CR-FM) is a leading AFM technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the "forest of peaks" frequency response associated with acoustic excitation methods effectively masks the true cantilever resonance. Using photothermal actuation results in clean contact resonance spectra, that closely match the ideal frequency response of the cantilever, allowing unambiguous and simple resonance frequency and quality factor measurements in air and liquids alike. This extends the capabilities of CR-FM to biologically relevant and other soft samples in liquid environments. We demonstrate CR-FM in air and water on both stiff silicon/titanium samples and softer polystyrene-polyethylene-polypropylene polymer samples with the quantitative moduli having very good agreement between expected and measured in both environments.

cond-mat.mes-hall↗