arXiv subjects

Songge Li

Publications and source records attributed to Songge Li.

3 recordsLinked to original sources

arXiv2026

Pushing the Dose Limit of Atomic-Resolution Imaging: A 4D-STEM case study of NaCl

Beam-induced damage fundamentally limits the characterization of beam-sensitive materials by scanning transmission electron microscopy (STEM), since structural information must be recorded before the electron beam irreversibly modifies the specimen. Here, sodium chloride (NaCl) is employed as a model beam-sensitive ionic crystal to investigate beam-induced structural evolution and the low-dose regime in which useful structural information can be recovered prior to significant damage. Four-dimensional STEM (4D-STEM) datasets were acquired at 200 kV using a Timepix3 direct electron detector and reconstructed using real-time integrated centre of mass (riCoM) imaging. We first establish the characteristic damage behavior of NaCl under high electron doses. Across different dwell times and raster scan orientations, damage develops reproducibly into square-faceted voids whose boundaries align with the 100 crystallographic directions of the rock-salt lattice, indicating that the morphology is governed predominantly by the intrinsic crystallography rather than the scan geometry. We then investigate the low-dose imaging regime using dose-fractionated acquisitions. At 130 e-A-2 per frame, normalized cross-correlation with respect to the first frame quantitatively tracks progressive structural degradation and enables the onset of measurable damage to be identified as a function of accumulated dose. A subsequent acquisition at 32 e-A-2 per frame demonstrates that atomic-scale spatial information can still be recovered below this damage threshold. These results demonstrate how dose-efficient 4D-STEM acquisition combined with riCoM imaging can extend the accessible imaging regime of highly beam-sensitive ionic materials while preserving atomic-scale information.

physics.app-ph↗

arXiv2026

Improving the low-dose performance of aberration correction in single sideband ptychography

The single sideband (SSB) framework of analytical electron ptychography can account for the presence of residual geometrical aberrations induced by the probe-forming lens. However, the accuracy of this aberration correction method is highly sensitive to noise, in part due to the necessity of phase unwrapping. In this work, we thus propose two strategies to improve aberration correction performance in low-dose conditions: confining phase unwrapping within the sidebands and selecting only well-unwrapped sidebands for calculating aberration coefficients. These strategies are validated through SSB reconstructions of both simulated and experimental 4D-STEM datasets of monolayer tungsten diselenide (WSe2). A comparison of results demonstrates significant improvements in Poisson noise tolerance, making aberration correction more robust and reliable for low-dose imaging.

physics.app-ph↗

arXiv2025

Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imaging

This study investigates the convergence properties of a collection of iterative electron ptychography methods, under low electron doses ($<$ 10$^3$ $e^-/A^2$) and gives particular attention to the impact of the user-defined update strengths. We demonstrate that carefully chosen values for this parameter, ideally smaller than those conventionally met in the literature, are essential for achieving accurate reconstructions of the projected electrostatic potential. Using a 4D dataset of a thin hybrid organic-inorganic formamidinium lead bromide (FAPbBr$_{3}$) sample, we show that convergence is in practice achievable only when the update strengths for both the object and probe are relatively small compared to what is found in literature. Additionally we demonstrate that under low electron doses, the reconstructions initial error increases when the update strength coefficients are reduced below a certain threshold emphasizing the existence of critical values beyond which the algorithms are trapped in local minima. These findings highlight the need for carefully optimized reconstruction parameters in iterative ptychography, especially when working with low electron doses, ensuring both effective convergence and correctness of the result.

cond-mat.mtrl-sci↗