@misc{indiciae8622e75a6648,
  title = {A statistical hardness classification of ultraluminous X-ray sources using long-term Swift/XRT monitoring},
  author = {Sinan Allak and Wei Yu and Menglei Zhou and Honghui Liu and Andrea Santangelo},
  year = {2026},
  doi = {10.1051/0004-6361/202662175},
  url = {https://arxiv.org/abs/2609.31324},
  note = {Source identifier: 2609.31324}
}