TY  - RPRT
TI  - A statistical hardness classification of ultraluminous X-ray sources using long-term Swift/XRT monitoring
AU  - Sinan Allak
AU  - Wei Yu
AU  - Menglei Zhou
AU  - Honghui Liu
AU  - Andrea Santangelo
PY  - 2026
DO  - 10.1051/0004-6361/202662175
UR  - https://arxiv.org/abs/2609.31324
ID  - 2609.31324
ER  -