TY  - RPRT
TI  - Assessing quantitative phase reliability in electron ptychography using a twisted trilayer WS2 thickness staircase
AU  - Hu Bao
AU  - Qilong Feng
AU  - Kun Ye
AU  - Tianyu Xue
AU  - Stephen J. Pennycook
AU  - Yihan Zhu
AU  - Anmin Nie
AU  - Shoucong Ning
AU  - Jing Tao
PY  - 2026
UR  - https://arxiv.org/abs/2610.13115
ID  - 2610.13115
ER  -