TY  - RPRT
TI  - Binder migration across film consolidation and pore emptying in electrode drying: a continuous model validated against drying-rate, thickness, and schedule experiments
AU  - Younghwan Joo
AU  - Sanghyun Oh
AU  - Sung-il Kim
PY  - 2026
UR  - https://arxiv.org/abs/2610.29286
ID  - 2610.29286
ER  -