TY  - RPRT
TI  - A Self-Consistent Two-Carrier Drift-Diffusion Framework for p-n Junctions: Extended Diode Equation, Power Dissipation, and Base Transit Time
AU  - Jianhong Yang
AU  - Tinglan Li
AU  - Gonghao Sun
PY  - 2026
UR  - https://arxiv.org/abs/2610.32112
ID  - 2610.32112
ER  -