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arXiv · 0906.5100

Resistive switching in nanogap systems on SiO2 substrates

Jun Yao·Lin Zhong·Zengxing Zhang·Tao He·Zhong Jin·Patrick J. Wheeler·Douglas Natelson·James M. Tour
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Abstract

Voltage-controlled resistive switching is demonstrated in various gap systems on SiO2 substrate. The nanosized gaps are made by different means using different materials including metal, semiconductor, and metallic nonmetal. The switching site is further reduced by using multi-walled carbon nanotubes and single-walled carbon nanotubes. The switching in all the gap systems shares the same characteristics. This independence of switching on the material compositions of the electrodes, accompanied by observable damage to the SiO2 substrate at the gap region, bespeaks the intrinsic switching from post-breakdown SiO2. It calls for caution when studying resistive switching in nanosystems on oxide substrates, since oxide breakdown extrinsic to the nanosystem can mimic resistive switching. Meanwhile, the high ON/OFF ratio (10E5), fast switching time (2 us, test limit), durable cycles demonstrated show promising memory properties. The intermediate states observed reveal the filamentary conduction nature.

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Jun Yao, Lin Zhong, Zengxing Zhang, Tao He, Zhong Jin, Patrick J. Wheeler, Douglas Natelson, James M. Tour. 2009-06-27. Resistive switching in nanogap systems on SiO2 substrates. https://doi.org/10.1002/smll.200901100

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