arXiv · 0908.3181
Measuring Charge Transport in an Amorphous Semiconductor Using Charge Sensing
Abstract
We measure charge transport in hydrogenated amorphous silicon (a-Si:H) using a nanometer scale silicon MOSFET as a charge sensor. This charge detection technique makes possible the measurement of extremely large resistances. At high temperatures, where the a-Si:H resistance is not too large, the charge detection measurement agrees with a direct measurement of current. The device geometry allows us to probe both the field effect and dispersive transport in the a-Si:H using charge sensing and to extract the density of states near the Fermi energy.
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K. MacLean, T. S. Mentzel, M. A. Kastner. 2009-08-21. Measuring Charge Transport in an Amorphous Semiconductor Using Charge Sensing. https://doi.org/10.1021/nl904280q
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