arXiv · 1103.5891
Single-electron shuttle based on a silicon quantum dot
Abstract
We report on single-electron shuttling experiments with a silicon metal-oxide-semiconductor quantum dot at 300 mK. Our system consists of an accumulated electron layer at the Si/SiO_2 interface below an aluminum top gate with two additional barrier gates used to deplete the electron gas locally and to define a quantum dot. Directional single-electron shuttling from the source and to the drain lead is achieved by applying a dc source-drain bias while driving the barrier gates with an ac voltage of frequency f_p. Current plateaus at integer levels of ef_p are observed up to f_p = 240 MHz operation frequencies. The observed results are explained by a sequential tunneling model which suggests that the electron gas may be heated substantially by the ac driving voltage.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
K. W. Chan, M. Mottonen, A. Kemppinen, N. S. Lai, K. Y. Tan, W. H. Lim, A. S. Dzurak. 2011-10-05. Single-electron shuttle based on a silicon quantum dot. https://doi.org/10.1063/1.3593491
Cite the original work for its findings. Save a collection to share your selection of sources.